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        第三代
        半導體測試家族
        Third generation semiconductor testing family
         
        
        
        分類
        
    
         
         
     
    
            
    
         
        
        
          
        
           
             
        
                         
               
        
                
                
                
        
        
    
        
      
     
    
    
         
            
            
        
                  
        
                       
                       
          
                          
                                             
                       
     
                          
                          
                       
        
           
                 
        
                 
        
           
                
                   

        
    
        
             
                   
                        
        
                            
        
                                
        
                                    
        
                                    
                                                        
                                                    
                    
                                 
                
                
                
                
                                        
                                                   
                                    
        
                                    
        
                                    
        
                                    
        
                                
        
                            
        
                            
        
                                                        
                            
                            
                            
         
                        
        
             
        
             
        
                    
        
                             
        Prober
        
                             
        Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading.
Fully automatic CCD visual n
        
                             
         


        

        

        
	
		
        
			
				
        
					 
				
        
				
        
					Suspended power supply
				
        
			        		
			
				
        
					 
				
        
				
        
					Multiple sites in parallel
				
        
			        		
			
				
        
					 
				
        
				
        
					Multi-channel high precision
				
        
			        		
			
				
        
					 
				
        
				
        
					Supports multiple extensions
				
        
			        		
		
        
	        

        
                             
        
                             
        
                                                          
        
                    
        
             
        
    
          
    
        
    

        
	
		
        
			
				Model 
			
			
				Prober
			
		
        
		
        
			
				Product introduction 
			
			
				Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading. 
        
			        		
		
        
		
        
			
				Features 
			
			
				? Fully automatic CCD visual needle positioning. 
        
         ? High-precision positioning platform. 
        
         ? Support normal high temperature testing. 
        
         ? Generate Mapping display Bin in real time. 
        
         ? Universal GPIB, TTL, R-232 interface. 
        
			        		
		
        
	        

        

        
                           
        

   
    
               
  
                
                
    
        
    
    
    
    
    
    
        
        
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