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      • 第三代
        半導體測試家族
        Third generation semiconductor testing family
        首頁 產(chǎn)品中心 Test System Power Device Testing System
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        QT-3107 LCR RG/CG test

        Self-developed LCR digital bridge supports Mosfet RG/CG testing and can also be used to test the capacitance of diodes with a resolution of 1fF.



        Support double DIE

        High precision and anti-interference

        Fast testing

        Extended 2KV bias

        Model QT-3107
        Product Advantages Using digital bridge, it has strong anti-interference ability and high test accuracy;
        The test time is 2-3 times faster than the analog bridge;
        Bias voltage up to 2KV;
        Key Features Test resolution 1fF;
        Self-equipped with ±100V bias source;
        Test frequency: 1MHz, extended to 2MHz;
        Output amplitude: 0.025-2V;




        Testing standards檢測標準
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