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      • 第三代
        半導體測試家族
        Third generation semiconductor testing family
        首頁 產品中心 Test System Power Device Testing System
        分類
         
        QT-3104 QG gate charge test

        QT-3104 QG meets the tiny QG value test of SiC devices.



        Support double DIE

        Overload and undervoltage protection

        High precision testing

        Support extension

        Model QT-3104 QG
        Product Advantages Meets the tiny QG value test of SiC devices
        Key Features ? Test capability: 200A/150V 150A/1000V




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