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        第三代
        半導(dǎo)體測(cè)試家族
        Third generation semiconductor testing family
         
        
        
        首頁(yè) 產(chǎn)品中心 Test System Power Device Testing System
        分類(lèi)
        
    
         
         
     
    
            
    
         
        
        
          
        
           
             
        
                         
               
        
                
                
                
        
        
    
        
      
     
    
    
         
            
            
        
                  
        
                       
                       
          
                          
                                             
                       
     
                          
                          
                       
        
           
                 
        
                 
        
           
                
                   

        
    
        
             
                   
                        
        
                            
        
                                
        
                                    
        
                                    
                                                        
                                                    
                    
                                 
                
                
                
                
                                        
                                                   
                                    
        
                                    
        
                                    
        
                                    
        
                                
        
                            
        
                            
        
                                                        
                            
                            
                            
         
                        
        
             
        
             
        
                    
        
                             
        QT-3101 UIL avalanche test
        
                             
        QT-3101 UIL avalanche test is suitable for testing avalanche parameters of MOSFETs, IGBTs and diodes
        
                             
         


        

        

        
	
		
        
			
				
        
					  
				
        
				
        
					Support double DIE 
				
        
			        		
			
				
        
					  
				
        
				
        
					Fast charging 
				
        
			        		
			
				
        
					  
				
        
				
        
					Save failure waveform
        
          
				
        
			        		
			
				
        
					  
				
        
				
        
					Clamp voltage function
        
          
				
        
			        		
		
        
	        

        
                             
        
                             
        
                                                          
        
                    
        
             
        
    
          
    
        
    

        
	
		
        
			
				Type 
			
			
				QT-3101 UIL
			
		
        
		
        
			
				Advantages 
			
			
				? Support VDD ON(E=1/2L*I*I*BVDSS/(BVDSS-VDD)) or VDD OFF(E=1/2*L*I*I) test
        
? Can share a computer with QT-4100B to achieve unified management of test programs and data
        
? Single pulse, multi-pulse or dual MOSFET testing can be set
        
? Real-time measurement monitors, output current, IDMAX, and Energy readouts
        
? The internal resistance of the inductor is low, the ID charging is fast, and the test time is shorter
        
? Built-in oscilloscope
        
			        		
		
        
		
        
			
				Main Features 
			
			
				? Output measurement capability: Maximum measurement BVdss: ±3000V Maximum output ID: ±150V, ±200A
        
                        ? Editable VG MAX: ±30V pulse width adjustment (resolution: 1us)
        
                        ? Programmable inductor box load 10μH-159.9mH step 10μH
        
                        ? 24 programmable sorting machine interface signals
        
			        		
		
        
	        

        

        

   
    
               
  
                
                
    
        
    
    
    
    
    
    
        
        
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