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      • 第三代
        半導(dǎo)體測(cè)試家族
        Third generation semiconductor testing family
        首頁(yè) 產(chǎn)品中心 Test System Power module and device testing system
        分類
         
        QT-8409PIM high-power dynamic and static comprehensive test system

        QT-8409PIM power module dynamic and static test system Applied to IGBT/SIC power module DC/AC dynamic and static parameter test, support high temperature/normal temperature, mass production/manual test, automatic/semi-automatic application scenarios



        High-speed short-circuit protection

        Low stray

        Flexible tooling

        Suitable for mass production/manual test

        Type
        QT-8409PIM
        Advantages Industry leading short circuit protection speed, effective protection of Socket, low stray solution
        Quickly change different tooling
        Main Features ? Support 4 stations
        ? ISC 12KA LS<30nH
        ? AC:SW、 TRR 、ISC、QG、RBSOA test
        ? AC@3000A 1500V
        ? DC@2000A 2KV /3KV/6KV/8KV
        ? Protect Clamp<2us
        ? Test object:PIM IGBT module, SiC module, DBC, three level products, etc

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