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      • 第三代
        半導(dǎo)體測(cè)試家族
        Third generation semiconductor testing family
        分類
         
        QT-8600RF Mixed Signal RF Test System

        RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test



        Suspended power supply

        Multiple sites in parallel

        Multi-channel high precision

        Supports multiple extensions

        Model QT-8600RF Mixed Signal RF Test System
        Product Advantages RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
        Key Features ? DC, digital, RF integrated machine
        ? 16 RF ports (8 in & 8 out)
        ? 6Ghz RF measurement circuit, power can be configured to 48dBm
        ? Self-developed RF source board and algorithm, UPH improves by more than 90% compared with traditional ones
        ? Supports vector and scalar testing
        ? Digital meets MIPI 50Mhz or above test
        ? Supports 2-station RF parallel testing and multi-station composite testing
        ? Provide a cost-effective test platform for RF switches, LNA, TUNER, filters and other devices.




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