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        Third generation
        
	Semiconductor Testing 

        

        
	family

        Third generation semiconductor testing family
         
        
        
        Home Product Test System Power Device Testing System
        MENU
        
    
         
         
     
    
            
    
      
     
    
    
         
            
            
        
                  
                 
        
           
                
                   

        
    
        
             
                   
                        
        
                            
        
                                
        
                                    
        
                                    
                                                        
                                                    
                    
                                 
                
                
                
                
                                        
                                                   
                                    
        
                                    
        
                                    
        
                                    
        
                                
        
                            
        
                            
        
                            
         
                        
        
             
        
             
        
                    
        
                             
        KGD (Know Good Die) testing solution
        
                             
        Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG;
Support testing pin card protection scheme;
Provide a complete set of testing + sorting solutions;
        
                             
         


        

        

        
	
		
        
			
				
        
					  
				
        
				
        
					Pin card 
				
        
				
        
					protection
        
              
				
        
			        		
			
				
        
					    
				
        
				
        
					Two-DUT test in parallel
        
              
				
        
			        		
			
				
        
					  
				
        
				
        
					High temperature and  
				
        
				
        
					normal temperature 
				
        
			        		
			
				
        
					  
				
        
				
        
					Data merge 
				
        
			        		
		
        
	        

        
                             
        
                             
        
                                                          
        
                    
        
             
        
    
          
    
        
    

        
	
		
        
			
				Model 
			
			
				KGD testing solutions
			
		
        
		
        
			
				Product Advantages 
			
			
				? Low spurious solutions;
        
                                                 ? Exclusive pin card protection patented technology;
        
                                                 ? Overload and undervoltage protection;
        
                                                 ? Test two wafers at a time;
        
                                                 ? Supports high temperature heating