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      • Third generation

        Semiconductor Testing

        family

        Third generation semiconductor testing family
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        QT-DRM101000 GaN Dynamic RDON

        Suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution



        Hard handover <1us

        Supports resistive/

        inductive loads

        Support hard/

        soft handover

        Multiple-pulse output

        Type QT-DRM101000
        Advantages

        QT-DRM101000 is suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution

        Main Features

        ? Support FT or CP, laboratory, mass production testing

        ? Hard handover and soft handover, hard handover can meet the requirement of<1uS measurement RDON

        ? Output capacity 10A/1000V