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      • Third generation

        Semiconductor Testing

        family

        Third generation semiconductor testing family
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        QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)

        Suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.



        Suspended power supply

        Multiple sites in parallel

        Multi-channel high precision

        Supports multiple extensions

        Model QT-8100
        Product Advantages

        The digital-analog hybrid IC test system is suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.

        Key Features ? Float V/I source with 4 quadrants
        ? Full resource extracted from the test box,support more than 8site test
        ? Digital speed 51.2MHz, vector depth 64M
        ? True parallel test, multiple 1000V/20A high voltage and high current
        ? 18 bit high precision sampling
        ? Multi-channel analog capability, supports up to 400 VI channels,Multi-channel digital capability, supports a maximum of 256VI channels
        ? Multi-channel high precision time measurement unit, supporting ns level time measurement
        ? Support RF module expansion
        ? Efficient communication configuration for more efficient testing